Publications
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A Practicable Method for Thickness Estimation of Ultrathin Layers from XPS Data with UNIFIT 2011
P. Streubel, R. Hesse, L. Makhova, J. Schindelka, R. Denecke
Technical Report, 2011 |
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Product or sum: comparative tests of Voigt, and product or sum Gaussian and Lorentzian functions in the fitting of synthetic Voigt-based x-ray photoelectron spectra
R. Hesse, P. Streubel, R. Szargan
Surf. Interface Anal., 2007, 39, 381 – 391
(1.2 MB PDF) |
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Improved
accuracy of quantitative analysis using predetermined
spectrometer transmission functions with UNIFIT 2004
R. Hesse, P. Streubel, R. Szargan
Surf. Interface Anal., 2005, 37, 589 - 607
(0.57
MB PDF)
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Error
estimation in peak-shape analysis of XPS core-level
spectra using UNIFIT 2003: how significant are the results
of peak fits?
R. Hesse, T. Chassé , P. Streubel, R. Szargan
Surf. Interface Anal. 2004,
36, 1373-1383
(0.2
MB PDF) |
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Unifit
2002 - universal analysis software for photoelectron
spectra
Hesse,
R.; Chassé, T.; Szargan
Anal.
Bioanal. Chem. 2003, 375,
856-863
(0.16
MB PDF) |
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Peak
shape analysis of core level photoelectron spectrausing
UNIFIT for WINDOWS
Hesse, R.; Chassé, T.; Szargan
R. Fresenius J. Anal. Chem. 1999, 365, 48-54
(0.4 MB PDF) |
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